Research Facilities
Surface Testing Facilities
Your Position: Facilities -> Surface Testing FacilitiesFacilities
Revetest Scratch Tester
Model: Revetest
Manufacturer:CSM,Switzerland 

Person in Charge:Peiling Ke 
Tel:+86-574-86685036

Main Parameters:
► scratch positive force load: 1 -- 200N
► positive force resolution: 3mN (range:100N )
► maximum scratch depth: ≥ 1000 μ 
► maximum scratch length: 70mm
► largest online observation length: 30mm
► scratch speed: 0.4 -- 600mm/min
► displacement depth resolution: 1.5nm (range:100 μ m )

Applications:
Scratch test system is mainly used for coating and substrate binding strength analysis.
Nano-Indentor
Model:Nano G200
Manufacturer:MTS, USA

Person in Charge:Dr. Jinlong Li 
Tel:+86-574-86685171

Main Parameters:
△Displacement resolution: <0.01nm
△Maximum load depth: >500mm
△Load resolution: 50nN
△Maximum load:10N
△Minimum load: 500mN

Applications:
Hybrid continuous stiffness measurement for the mechanical and tribological properties of the bulk
materials (polymers, metal, alloy etc.) and the thin solid films. The properties include hardness,elastic
modulus, film adhesion, coefficient of friction and fracture toughness etc. can be measured.
Alpha-Step IQ Surface Profiler
Model:Alpha-Step IQ
Manufacturer:KLA-Tencor Corporation,USA

Person in Charge:Lili Sun 
Tel:+86-574-86685165

Main Parameters:
△Scan length:≤10mm
△Maximum step-height:≤1.9mm
△Scan speed:2 ~ 200μm/s
△Vertical resolution:0.328Å at 550μm thickness
△Maximum thickness of sample:21mm
△Maximum weight of sample:1kg

Applications:
The Alpha-Step IQ Profiler is a computerized, high-sensitivity surface profiler, which can measure the film roughness, waviness, and thickness in a variety of
applications.
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